Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N
- Rigutti, L.
- Mancini, L.
- Hernández-Maldonado, D.
- Lefebvre, W.
- Giraud, E.
- Butté, R.
- Carlin, J.F.
- Grandjean, N.
- Blavette, D.
- Vurpillot, F.
ISSN: 1089-7550, 0021-8979
Year of publication: 2016
Volume: 119
Issue: 10
Type: Article