HAADF-STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy
- Lefebvre, W.
- Hernandez-Maldonado, D.
- Moyon, F.
- Cuvilly, F.
- Vaudolon, C.
- Shinde, D.
- Vurpillot, F.
ISSN: 1879-2723, 0304-3991
Year of publication: 2015
Volume: 159
Pages: 403-412
Type: Article