Robust statistical inference for one-shot devices based on divergences

  1. Castilla Gonzalez, Elena Maria
Dirigida per:
  1. Nirian Martín Apaolaza Directora
  2. Leandro Pardo Llorente Director

Universitat de defensa: Universidad Complutense de Madrid

Fecha de defensa: 30 de de juny de 2021

Tribunal:
  1. Pedro Miranda Menéndez President
  2. Juana María Alonso Revenga Secretària
  3. Isabel Molina Peralta Vocal
  4. Ayanendranath Basu Vocal
  5. María Angeles Gil Alvarez Vocal
Departament:
  1. Economía Financiera, Actuarial y Estadística

Tipus: Tesi

Resum

A one-shot device is a unit that performs its function only once and, after use, the device either gets destroyed or must be rebuilt. For this kind of device, one can only know whether the failure time is either before or after a speci c inspection time, and consequently the lifetimes are either left- or right-censored, with the lifetime being less than the inspection time if the test outcome is a failure (resulting in left censoring) and the lifetime being more than the inspection time if the test outcome is a success (resulting in right censoring). An accelerated life test (ALT) plan is usually employed to evaluate the reliability of such products by increasing the levels of stress factors and then extrapolating the life characteristics from high stress conditions to normal operating conditions. This acceleration process will shorten the life span of devices and reduce the costs associated with the experiment. The study of one-shot device from ALT data has been developed considerably recently, mainly motivated by the work of Fan et al. [2009]...