DAVID
HERNÁNDEZ MALDONADO
Postdoctoral UCM
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Daresbury Laboratory
Warrington, Reino UnidoDaresbury Laboratory-ko ikertzaileekin lankidetzan egindako argitalpenak (6)
2017
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Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy
Nano Letters, Vol. 17, Núm. 7, pp. 4261-4269
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Reverse Monte Carlo reconstruction algorithm for discrete electron tomography based on HAADF-STEM atom counting
Journal of Microscopy, Vol. 265, Núm. 1, pp. 73-80
2016
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HAADF-STEM analysis of the composition distribution in InAlAsSb/InGaAs/InP layers for solar cells applications
Microscopy and Microanalysis
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Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls
Applied Physics Letters, Vol. 108, Núm. 4
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Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N
Journal of Applied Physics, Vol. 119, Núm. 10
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Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers
Semiconductor Science and Technology, Vol. 31, Núm. 9