JUAN ANTONIO
CLEMENTE BARREIRA
Profesor titular de universidad
Publicaciones (56) Publicaciones de JUAN ANTONIO CLEMENTE BARREIRA
2024
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Non-intrusive study on FPGA of the SEU sensitivity on the COTS RISC-V VeeR EH1 soft processor from Western Digital
Microprocessors and Microsystems, Vol. 105
2023
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A Method to Neutralize the Impact of DVS on the Reliability of COTS SRAMs With ECC by Using Periodic Scrubbing
IEEE Transactions on Nuclear Science, Vol. 70, Núm. 12, pp. 2578-2589
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SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles
Microprocessors and Microsystems, Vol. 96
2022
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Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation
IEEE Transactions on Nuclear Science, Vol. 69, Núm. 2, pp. 126-133
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Reliability of Error Correction Codes Against Multiple Events by Accumulation
IEEE Transactions on Nuclear Science, Vol. 69, Núm. 2, pp. 169-180
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Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories
IEEE Access, Vol. 10, pp. 114566-114585
2021
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Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs
2021 IEEE 22nd Latin American Test Symposium, LATS 2021
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Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs
RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems
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Impact of the bitcell topology on the multiple-cell upsets observed in VLSI nanoscale SRAMs
IEEE Transactions on Nuclear Science, Vol. 68, Núm. 9, pp. 2383-2391
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Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles
2021 IEEE 22nd Latin American Test Symposium, LATS 2021
2020
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Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets
Reliability Engineering and System Safety, Vol. 202
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Evaluation of a COTS 65-nm SRAM under 15 MeV Protons and 14 MeV Neutrons at Low VDD
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 10, pp. 2188-2195
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Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 11, pp. 2345-2352
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Impact of High Particle Flux in Radiation Ground Tests with Protons
2020 20th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2020 - Proceedings
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Impact of ground-level enhancement (GLE) solar events on soft error rate for avionics
IEEE Transactions on Aerospace and Electronic Systems, Vol. 56, Núm. 5, pp. 3674-3984
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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1547-1554
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Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1461-1469
2019
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Influence of randomness during the interpretation of results from single-event experiments on SRAMs
IEEE Transactions on Device and Materials Reliability, Vol. 19, Núm. 1, pp. 104-111
2018
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A decomposition-based reliability and makespan optimization technique for hardware task graphs
Reliability Engineering and System Safety, Vol. 180, pp. 13-24
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Analysis of the reconfiguration latency and energy overheads for a Xilinx Virtex-5 fieldprogrammable gate array
IET Computers and Digital Techniques, Vol. 12, Núm. 4, pp. 150-157