Arquitectura de Computadores y Automática
Departamento
Grenoble Alpes University
Saint-Martin-d’Hères, FranciaPublicaciones en colaboración con investigadores/as de Grenoble Alpes University (17)
2023
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Layered Decoding of Quantum LDPC Codes
2023 12th International Symposium on Topics in Coding, ISTC 2023
2022
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Machine Learning in Pansharpening: A benchmark, from shallow to deep networks
IEEE Geoscience and Remote Sensing Magazine, Vol. 10, Núm. 3, pp. 279-315
2020
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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1547-1554
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Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1461-1469
2019
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Influence of randomness during the interpretation of results from single-event experiments on SRAMs
IEEE Transactions on Device and Materials Reliability, Vol. 19, Núm. 1, pp. 104-111
2018
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SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2-MeV Neutrons
IEEE Transactions on Nuclear Science, Vol. 65, Núm. 8, pp. 1858-1865
2017
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Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage
IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2188-2195
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Statistical Deviations from the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMs
IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2152-2160
2016
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Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2193-2200
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Evaluation of the sensitivity of a COTS 90-nm SRAM memory at low bias voltage
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
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Single events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons
IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2072-2079
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Some properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
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Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs
IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2087-2094
2015
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Neutron-induced single events in a COTS soft-error free SRAM at low bias voltage
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
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Sensitivity to neutron radiation of a 45 nm SOI multi-core processor
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
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Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
2014
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Evidence of the robustness of a cots soft-error free SRAM to Neutron Radiation
IEEE Transactions on Nuclear Science, Vol. 61, Núm. 6, pp. 3103-3108