Posibilidades de la topografía por difracción de Rayos X en el estudio de la génesis y evolución de los cristales
- Santos, A.
- Martín-Vivaldi Caballero, Juan Luis
ISSN: 0213-0696
Datum der Publikation: 1983
Nummer: 1
Seiten: 149-161
Art: Artikel
Andere Publikationen in: Revista de materiales y procesos geológicos
Zusammenfassung
In the present work, the posibilities of X-ray topography (Lang-technique), in the way of to obtain a genetic information of natural and artificial crystals, are show. A Lang camera was put on. The resolution power was calculated. Topographs of quarzt natural crystals and brushite artificial crystals were obtained and explained. From that topographs, genetic conclusions are stabhished (presence of growth bands, dentritic growth, dislocation growth, and so on).