Imaging Ellipsometry Determination of the Refractive Index Contrast and Dispersion of Channel Waveguides Inscribed by fs-Laser Induced Ion-Migration
- Moreno-Zarate, P.
- Gonzalez, A.
- Funke, S.
- Días, A.
- Sotillo, B.
- del Hoyo, J.
- Garcia-Pardo, M.
- Serna, R.
- Fernandez, P.
- Solis, J.
ISSN: 1862-6319, 1862-6300
Ano de publicación: 2018
Volume: 215
Número: 19
Tipo: Artigo