Imaging Ellipsometry Determination of the Refractive Index Contrast and Dispersion of Channel Waveguides Inscribed by fs-Laser Induced Ion-Migration

  1. Moreno-Zarate, P.
  2. Gonzalez, A.
  3. Funke, S.
  4. Días, A.
  5. Sotillo, B.
  6. del Hoyo, J.
  7. Garcia-Pardo, M.
  8. Serna, R.
  9. Fernandez, P.
  10. Solis, J.
Revista:
Physica Status Solidi (A) Applications and Materials Science

ISSN: 1862-6319 1862-6300

Ano de publicación: 2018

Volume: 215

Número: 19

Tipo: Artigo

DOI: 10.1002/PSSA.201800258 GOOGLE SCHOLAR