A microspectroscopic study of cap damage in annealed RE-doped AlN-capped GaN
- Nogales, E.
- Lorenz, K.
- Wang, K.
- Roqan, I.S.
- Martin, R.W.
- O'Donnell, K.P.
- Alves, E.
- Ruffenach, S.
- Briot, O.
ISSN: 0272-9172
ISBN: 9781558998469
Year of publication: 2006
Volume: 892
Pages: 625-630
Type: Conference paper