Neutron-induced single events in a COTS soft-error free SRAM at low bias voltage

  1. Clemente, J.A.
  2. Franco, F.J.
  3. Villa, F.
  4. Baylac, M.
  5. Ramos, P.
  6. Vargas, V.
  7. Mecha, H.
  8. Agapito, J.A.
  9. Velazco, R.
Konferenzberichte:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

ISBN: 9781509002313

Datum der Publikation: 2015

Ausgabe: 2015-December

Art: Konferenz-Beitrag

DOI: 10.1109/RADECS.2015.7365640 GOOGLE SCHOLAR