Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs

  1. Clemente, J.A.
  2. Franco, F.J.
  3. Villa, F.
  4. Baylac, M.
  5. Rey, S.
  6. Mecha, H.
  7. Agapito, J.A.
  8. Puchner, H.
  9. Hubert, G.
  10. Velazco, R.
Aktak:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

ISBN: 9781509002313

Argitalpen urtea: 2015

Alea: 2015-December

Mota: Biltzar ekarpena

DOI: 10.1109/RADECS.2015.7365670 GOOGLE SCHOLAR
Datuen iturria: Scopus