Amorphous/crystalline silicon interface characterization by capacitance and conductance measurements
- Garcia-Hernansanz, R.
- Garcia-Hemme, E.
- Montero-Alvarez, D.
- Del Prado, A.
- Martil, I.
- Gonzalez-Diaz, G.
- Olea, J.
Proceedings:
Proceedings of the 2015 10th Spanish Conference on Electron Devices, CDE 2015
ISBN: 9781479981083
Year of publication: 2015
Type: Conference paper