Fast label-free optical diffraction tomography compatible with conventional wide-field microscopes

  1. Rodrigo, J.A.
  2. Soto, J.M.
  3. Alieva, T.
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

ISBN: 9781510627994

Année de publication: 2019

Volumen: 11060

Type: Communication dans un congrès

DOI: 10.1117/12.2525840 GOOGLE SCHOLAR
La source de données: Scopus