Optical diffraction tomography with fully and partially coherent illumination in high numerical aperture label-free microscopy [Invited]

  1. Soto, J.M.
  2. Rodrigo, J.A.
  3. Alieva, T.
Aldizkaria:
Applied Optics

ISSN: 2155-3165,  1559-128X

Argitalpen urtea: 2018

Alea: 57

Zenbakia: 1

Orrialdeak: A205-A214

Mota: Artikulua

DOI: 10.1364/AO.57.00A205 GOOGLE SCHOLAR
Datuen iturria: Scopus