Electrical and optical characterization of GaN HVPE layers related to extended defects

  1. Castaldini, A.
  2. Cavallini, A.
  3. Polenta, L.
  4. Díaz-Guerra, C.
  5. Piqueras, J.
Revue:
Journal of Physics Condensed Matter

ISSN: 0953-8984

Année de publication: 2002

Volumen: 14

Número: 48

Pages: 13095-13104

Type: Article

DOI: 10.1088/0953-8984/14/48/355 GOOGLE SCHOLAR
La source de données: Scopus