Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices

  1. López-Calle, I.
  2. Franco, F.J.
  3. Agapito, J.A.
  4. Izquierdo, J.G.
Konferenzberichte:
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011

ISBN: 9781424478637

Datum der Publikation: 2011

Art: Konferenz-Beitrag

DOI: 10.1109/SCED.2011.5744202 GOOGLE SCHOLAR
Datenquelle: Scopus