Comparison of Raman-scattering and Shubnikov-de Haas measurements to determine charge density in doped semiconductors

  1. Cuscó, R.
  2. Artús, L.
  3. Ibáñez, J.
  4. Blanco, N.
  5. González-Díaz, G.
  6. Rahman, M.
  7. Long, A.R.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2000

Volume: 88

Issue: 11

Pages: 6567-6570

Type: Review

DOI: 10.1063/1.1322593 GOOGLE SCHOLAR
Data source: Scopus