Characterization of Si implantation and annealing of InP by Raman spectroscopy

  1. Artus, L.
  2. Cusco, R.
  3. Martin, J.M.
  4. Gonzalez-Diaz, G.
Aktak:
Materials Research Society Symposium - Proceedings

ISSN: 0272-9172

Argitalpen urtea: 1995

Alea: 354

Orrialdeak: 213-217

Mota: Biltzar ekarpena