Accurate gate impedance determination on ultraleaky MOSFETs by fitting to a three-lumped-parameter model at frequencies from DC to RF
- San Andrés, E.
- Pantisano, L.
- Ramos, J.
- Roussel, P.J.
- O'Sullivan, B.J.
- Toledano-Luque, M.
- DeGendt, S.
- Groeseneken, G.
ISSN: 0018-9383
Year of publication: 2007
Volume: 54
Issue: 7
Pages: 1705-1712
Type: Article