Accurate gate impedance determination on ultraleaky MOSFETs by fitting to a three-lumped-parameter model at frequencies from DC to RF

  1. San Andrés, E.
  2. Pantisano, L.
  3. Ramos, J.
  4. Roussel, P.J.
  5. O'Sullivan, B.J.
  6. Toledano-Luque, M.
  7. DeGendt, S.
  8. Groeseneken, G.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2007

Volume: 54

Issue: 7

Pages: 1705-1712

Type: Article

DOI: 10.1109/TED.2007.898473 GOOGLE SCHOLAR