Influence of RF-sputtering power on formation of vertically stacked Si 1-x Ge x nanocrystals between ultra-thin amorphous Al 2 O 3 layers: Structural and photoluminescence properties
- Vieira, E.M.F.
- Martín-Sánchez, J.
- Roldan, M.A.
- Varela, M.
- Buljan, M.
- Bernstorff, S.
- Barradas, N.P.
- Franco, N.
- Correia, M.R.
- Rolo, A.G.
- Pennycook, S.J.
- Molina, S.I.
- Alves, E.
- Chahboun, A.
- Gomes, M.J.M.
ISSN: 0022-3727, 1361-6463
Argitalpen urtea: 2013
Alea: 46
Zenbakia: 38
Mota: Artikulua