Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces

1. Varela, M.
2. Gazquez, J.
3. Lupini, A.R.
4. Luck, J.T.
5. Torija, M.A.
6. Sharma, M.
7. Leighton, C.
8. Biegalski, M.D.
9. Christen, H.M.
10. Murfitt, M.
11. Dellby, N.
12. Krivanek, O.
13. Pennycook, S.J.