Coercive and anisotropy fields in patterned amorphous FeSi submicrometric structures

  1. Vélez, M.
  2. Morales, R.
  3. Alameda, J.M.
  4. Briones, F.
  5. Martín, J.I.
  6. Vicent, J.L.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 2000

Volumen: 87

Número: 9 II

Pages: 5654-5656

Type: Article