The effect of five mechanical instrumentation protocols on implant surface topography and roughness: A scanning electron microscope and confocal laser scanning microscope analysis
- Cha, J.-K.
- Paeng, K.
- Jung, U.-W.
- Choi, S.-H.
- Sanz, M.
- Sanz-Martín, I.
ISSN: 1600-0501, 0905-7161
Argitalpen urtea: 2019
Alea: 30
Zenbakia: 6
Orrialdeak: 578-587
Mota: Artikulua