Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

  1. Fabero, J.C.
  2. Mecha, H.
  3. Franco, F.J.
  4. Clemente, J.A.
  5. Korkian, G.
  6. Rey, S.
  7. Cheymol, B.
  8. Baylac, M.
  9. Hubert, G.
  10. Velazco, R.
Revue:
IEEE Transactions on Nuclear Science

ISSN: 1558-1578 0018-9499

Année de publication: 2020

Volumen: 67

Número: 7

Pages: 1461-1469

Type: Article

DOI: 10.1109/TNS.2020.2977874 GOOGLE SCHOLAR