A pattern matching approach to the automatic selection of particles from low-contrast electron micrographs
- Abrishami, V.
- Zaldívar-Peraza, A.
- De La Rosa-Trevín, J.M.
- Vargas, J.
- Otón, J.
- Marabini, R.
- Shkolnisky, Y.
- Carazo, J.M.
- Sorzano, C.O.S.
ISSN: 1460-2059, 1367-4803
Year of publication: 2013
Volume: 29
Issue: 19
Pages: 2460-2468
Type: Article