A test vector generation method based on symbol error probabilities for low-complexity chase soft-decision reed-solomon decoding

  1. Valls, J.
  2. Torres, V.
  3. Canet, M.J.
  4. Garcia-Herrero, F.M.
Aldizkaria:
IEEE Transactions on Circuits and Systems I: Regular Papers

ISSN: 1549-8328

Argitalpen urtea: 2019

Alea: 66

Zenbakia: 6

Orrialdeak: 2198-2207

Mota: Artikulua

DOI: 10.1109/TCSI.2018.2882876 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus