Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls
- Mancini, L.
- Hernández-Maldonado, D.
- Lefebvre, W.
- Houard, J.
- Blum, I.
- Vurpillot, F.
- Eymery, J.
- Durand, C.
- Tchernycheva, M.
- Rigutti, L.
Aldizkaria:
Applied Physics Letters
ISSN: 0003-6951
Argitalpen urtea: 2016
Alea: 108
Zenbakia: 4
Mota: Artikulua