Characterization of thin silicon overlayers on rutile TiO2 (110 ) - (1×1 )
- Abad, J.
- Gonzalez, C.
- De Andres, P.L.
- Roman, E.
ISSN: 1098-0121, 1550-235X
Argitalpen urtea: 2010
Alea: 82
Zenbakia: 16
Mota: Artikulua
Aldizkaria:
Physical Review B - Condensed Matter and Materials Physics