'All-inclusive' imaging of the rutile TiO2 (110) surface using NC-AFM

  1. Bechstein, R.
  2. Gonźalez, C.
  3. Schütte, J.
  4. Jeĺinek, P.
  5. Ṕerez, R.
  6. Kühnle, A.
Journal:
Nanotechnology

ISSN: 1361-6528,  0957-4484

Year of publication: 2009

Volume: 20

Issue: 50

Type: Article

DOI: 10.1088/0957-4484/20/50/505703 GOOGLE SCHOLAR
Data source: Scopus