Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range

  1. Morlanes, T.
  2. De La Peña, J.L.
  3. Sanchez-Brea, L.M.
  4. Alonso, J.
  5. Crespo, D.
  6. Saez-Landete, J.B.
  7. Bernabeu, E.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Year of publication: 2005

Volume: 5840 PART II

Pages: 862-870

Type: Conference paper

DOI: 10.1117/12.628135 GOOGLE SCHOLAR
Data source: Scopus