Robust trapped-ion quantum logic gates by continuous dynamical decoupling
- Bermudez, A.
- Schmidt, P.O.
- Plenio, M.B.
- Retzker, A.
ISSN: 1050-2947, 1094-1622
Année de publication: 2012
Volumen: 85
Número: 4
Type: Article
Revue:
Physical Review A - Atomic, Molecular, and Optical Physics
