Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation
- Rezaei, M.
- Hubert, G.
- Martin-Holgado, P.
- Morilla, Y.
- Fabero, J.C.
- Mecha, H.
- Franco, F.J.
- Puchner, H.
- Clemente, J.A.
ISSN: 1558-1578, 0018-9499
Année de publication: 2022
Volumen: 69
Número: 2
Pages: 126-133
Type: Article