Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation

  1. Rezaei, M.
  2. Hubert, G.
  3. Martin-Holgado, P.
  4. Morilla, Y.
  5. Fabero, J.C.
  6. Mecha, H.
  7. Franco, F.J.
  8. Puchner, H.
  9. Clemente, J.A.
Revue:
IEEE Transactions on Nuclear Science

ISSN: 1558-1578,  0018-9499

Année de publication: 2022

Volumen: 69

Número: 2

Pages: 126-133

Type: Article

DOI: 10.1109/TNS.2022.3140473 GOOGLE SCHOLAR
La source de données: Scopus