Analysis of functional errors produced by long-Term workload-dependent bti degradation in ultralow power processors

  1. Duch, L.
  2. Peon-Quiros, M.
  3. Weckx, P.
  4. Levisse, A.
  5. Braojos, R.
  6. Catthoor, F.
  7. Atienza, D.
Aldizkaria:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1557-9999,  1063-8210

Argitalpen urtea: 2020

Alea: 28

Zenbakia: 10

Orrialdeak: 2122-2133

Mota: Artikulua

DOI: 10.1109/TVLSI.2020.3003471 GOOGLE SCHOLAR
Datuen iturria: Scopus