Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

  1. Brown, H.G.
  2. Ishikawa, R.
  3. S´anchez-Santolino, G.
  4. Shibata, N.
  5. Ikuhara, Y.
  6. Allen, L.J.
  7. Findlay, S.D.
Revue:
Ultramicroscopy

ISSN: 1879-2723 0304-3991

Année de publication: 2019

Volumen: 197

Pages: 112-121

Type: Article

DOI: 10.1016/J.ULTRAMIC.2018.12.010 GOOGLE SCHOLAR