A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging

  1. Brown, H.G.
  2. Ishikawa, R.
  3. Sánchez-Santolino, G.
  4. Lugg, N.R.
  5. Ikuhara, Y.
  6. Allen, L.J.
  7. Shibata, N.
Journal:
Ultramicroscopy

ISSN: 1879-2723,  0304-3991

Year of publication: 2017

Volume: 173

Pages: 76-83

Type: Article

DOI: 10.1016/J.ULTRAMIC.2016.11.024 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus