Multiple Cell Upset Injection in BRAMs for Xilinx FPGAS

  1. Ullah, A.
  2. Reviriego, P.
  3. Sanchez-Macian, A.
  4. Maestro, J.A.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1558-2574,  1530-4388

Year of publication: 2018

Volume: 18

Issue: 4

Pages: 636-638

Type: Article

DOI: 10.1109/TDMR.2018.2878806 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus