Multiple cell upset correction in memories using difference set codes

  1. Reviriego, P.
  2. Flanagan, M.F.
  3. Liu, S.-F.
  4. Maestro, J.A.
Revue:
IEEE Transactions on Circuits and Systems I: Regular Papers

ISSN: 1549-8328

Année de publication: 2012

Volumen: 59

Número: 11

Pages: 2592-2599

Type: Article

DOI: 10.1109/TCSI.2012.2190632 GOOGLE SCHOLAR
La source de données: Scopus