Number of events and time to failure distributions for error correction protected memories

  1. Reviriego, P.
  2. Holst, L.
  3. Maestro, J.A.
Aldizkaria:
IEEE Transactions on Device and Materials Reliability

ISSN: 1530-4388,  1530-4388

Argitalpen urtea: 2010

Alea: 10

Zenbakia: 3

Orrialdeak: 381-389

Mota: Artikulua

DOI: 10.1109/TDMR.2010.2055159 GOOGLE SCHOLAR
Datuen iturria: Scopus