An experimental analysis of SEU sensitiveness on system knowledge-based hardening techniques
- Ruano, O.
- Reyes, P.
- Maestro, J.A.
- Sterpone, L.
- Reviriego, P.
Konferenzberichte:
Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS
ISBN: 9781424411610
Datum der Publikation: 2007
Seiten: 261-266
Art: Konferenz-Beitrag