Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles

  1. Fabero, J.C.
  2. Korkian, G.
  3. Franco, F.J.
  4. Mecha, H.
  5. Letiche, M.
  6. Clemente, J.A.
Konferenzberichte:
2021 IEEE 22nd Latin American Test Symposium, LATS 2021

ISBN: 9781665420570

Datum der Publikation: 2021

Art: Konferenz-Beitrag

DOI: 10.1109/LATS53581.2021.9651879 GOOGLE SCHOLAR