Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles
- Fabero, J.C.
- Korkian, G.
- Franco, F.J.
- Mecha, H.
- Letiche, M.
- Clemente, J.A.
Konferenzberichte:
2021 IEEE 22nd Latin American Test Symposium, LATS 2021
ISBN: 9781665420570
Datum der Publikation: 2021
Art: Konferenz-Beitrag