Review and Comparison of Irradiation Response and Annealing Models for High-Sensitivity RADFETs
- Benito-Parejo, M.
- Ibarmia, S.
- Portillo, P.
Actas:
2017 17th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2017
ISBN: 9781538612613
Ano de publicación: 2017
Tipo: Achega congreso