Probing Nanoparticle Magnetism by Aberration Corrected STEM-EELS

  1. Gazquez, J.
  2. Salafranca, J.
  3. Perez, N.
  4. Labarta, A.
  5. Pantelides, S.T.
  6. Pennycook, S.J.
  7. Batlle, X.
  8. Varela, M.
Revue:
Microscopy and Microanalysis

ISSN: 1435-8115,  1431-9276

Année de publication: 2012

Volumen: 18

Número: S2

Pages: 1362-1363

Type: Article

DOI: 10.1017/S1431927612008665 GOOGLE SCHOLAR
La source de données: Scopus