Prospects for single atom location and identification with aberration-corrected STEM

  1. Lupini, A.R.
  2. Varela, M.
  3. Borisevich, A.Y.
  4. Peng, Y.
  5. Pennycook, S.J.
Buch:
Microscopy of Semiconducting Materials 2003

ISBN: 9781315895536

Datum der Publikation: 2018

Seiten: 523-532

Art: Buch-Kapitel

DOI: 10.1201/9781351074636 GOOGLE SCHOLAR