Power divergence approach for one-shot device testing under competing risks
- Balakrishnan, N.
- Castilla, E.
- Martin, N.
- Pardo, L.
Aldizkaria:
Journal of Computational and Applied Mathematics
ISSN: 0377-0427
Argitalpen urtea: 2023
Alea: 419
Mota: Artikulua