EXAFS characterization of nickel clusters in Ni/Si3N4 sputtered thin films
- Vila, M.
- Jiménez-Villacorta, F.
- Prieto, C.
- Traverse, A.
Proceedings:
Physica Scripta T
ISSN: 0281-1847
Year of publication: 2005
Volume: T115
Pages: 454-456
Type: Article