Main memory organization trade-offs with DRAM and STT-MRAM options based on gem5-NVMain simulation frameworks

  1. Komalan, Manu
  2. Rock, Oh Hyung
  3. Hartmann, Matthias
  4. Sakhare, Sushil
  5. Tenllado, Christian
  6. Gomez, Jose Ignacio
  7. Kar, Gouri Sankar
  8. Furnemont, Arnaud
  9. Catthoor, Francky
  10. Senni, Sophiane
  11. Novo, David
  12. Gamatie, Abdoulaye
  13. Torres, Lionel
Liburu bilduma:
PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)

ISSN: 1530-1591

ISBN: 978-3-9819-2630-9

Argitalpen urtea: 2018

Orrialdeak: 103-108

Biltzarra: Design, Automation and Test in Europe Conference and Exhibition (DATE)

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS