A general Best-Worst method considering interdependency with application to innovation and technology assessment at NASA
- Tavana, M.
- Mina, H.
- Santos-Arteaga, F.J.
Aldizkaria:
Journal of Business Research
ISSN: 0148-2963
Argitalpen urtea: 2023
Alea: 154
Mota: Artikulua