Artifacts-free fourier ptychographic microscopy using a misaligned setup

  1. Bianco, V.
  2. Mandracchia, B.
  3. Běhal, J.
  4. Barone, D.
  5. Memmolo, P.
  6. Ferraro, P.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

ISBN: 9781510644069

Ano de publicación: 2021

Volume: 11786

Tipo: Achega congreso

DOI: 10.1117/12.2592550 GOOGLE SCHOLAR
Fonte de datos: Scopus