Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques

  1. Miranda, JM
  2. Fager, C
  3. Zirath, H
  4. Sakalas, P
  5. Munoz, S
  6. Sebastian, JL
Büchersammlung:
IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3

ISSN: 1091-5281

ISBN: 0-7803-6646-8

Datum der Publikation: 2001

Seiten: 530-533

Kongress: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001)

Art: Konferenz-Beitrag

GOOGLE SCHOLAR
Fuente de los datos: WoS