Advances in aberration corrected STEM at ORNL

  1. Lupini, AR
  2. Varela, M
  3. Borisevich, AY
  4. Travaglini, SM
  5. Pennycook, SJ
Liburu bilduma:
ELECTRON MICROSCOPY AND ANALYSIS 2003
  1. McVitie, S (coord.)
  2. McComb, D (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0967-9

Argitalpen urtea: 2004

Orrialdeak: 211-214

Biltzarra: Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003)

Mota: Biltzar ekarpena

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Datuen iturria: WoS